Characterization of a Sapphire Optical Wall Shear Stress Sensor for High-temperature Applications

Authors

David A. Mills
Daniel Blood, Valparaiso University
Mark Sheplak

Document Type

Book Chapter/Entry

Publication Date

1-2-2016

Journal Title

54th AIAA Aerospace Sciences Meeting

Recommended Citation

Mills, David A.; Blood, Daniel; and Sheplak, Mark, "Characterization of a Sapphire Optical Wall Shear Stress Sensor for High-temperature Applications" (2016). Engineering Faculty Publications, Patents, Presentations. 44.
https://scholar.valpo.edu/engineering_fac_pub/44