Measuring the Differential Cross Section in Compton Scattering of 0.662 MeV Photons
Faculty Sponsor
Shirvel Stanislaus
College
Arts and Sciences
Discipline(s)
Physics
ORCID Identifier(s)
orcid.org/0000-0003-4834-1712
Presentation Type
Poster Presentation
Symposium Date
Spring 4-23-2016
Abstract
The Klein-Nishina formula will be tested by determining the differential cross section of Compton scattered photons. A NaI detector will be used to detect scattered photons off of an aluminum target at various angles from a 137Cs source of energy 0.662 MeV. Previous studies by students Josh Vredevoogd and Joel Rogers have shown discrepancies for lower angle measurements, which this experiment seeks to remedy.
Recommended Citation
Place, Stephen, "Measuring the Differential Cross Section in Compton Scattering of 0.662 MeV Photons" (2016). Symposium on Undergraduate Research and Creative Expression (SOURCE). 489.
https://scholar.valpo.edu/cus/489
Biographical Information about Author(s)
Stephen Place is a senior physics and mathematics major. He has plans to attend the University of California - Irvine for graduate school in experimental high energy physics.