Measuring the Differential Cross Section in Compton Scattering of 0.662 MeV Photons

Faculty Sponsor

Shirvel Stanislaus

College

Arts and Sciences

Discipline(s)

Physics

ORCID Identifier(s)

orcid.org/0000-0003-4834-1712

Presentation Type

Poster Presentation

Symposium Date

Spring 4-23-2016

Abstract

The Klein-Nishina formula will be tested by determining the differential cross section of Compton scattered photons. A NaI detector will be used to detect scattered photons off of an aluminum target at various angles from a 137Cs source of energy 0.662 MeV. Previous studies by students Josh Vredevoogd and Joel Rogers have shown discrepancies for lower angle measurements, which this experiment seeks to remedy.

Biographical Information about Author(s)

Stephen Place is a senior physics and mathematics major. He has plans to attend the University of California - Irvine for graduate school in experimental high energy physics.

This document is currently not available here.

Share

COinS